Digital Magazine

Stay safe from harm - Guidance on Security, BI and ITSM

Adrian Bloem
CMS Watch
Derek Brink
Aberdeen Group
Julie Craig and Scott Crawford
Enterprise Management Associates
Martin Kuppinger
Cuppinger Cole
Managing Editor: Ali Klaver
Published the 7th of February 2010 by Informed Market Intelligence

As always, innovation is the cornerstone of all information technology—including
those developments created to do harm. It's how fast these new developments can be
implemented that is key to business success or failure.
In an environment that is in a constant state of action and change, how is it
possible to manage your business processes in a secure and cost-effective way? We
have a number of industry experts in this issue of ETM dedicated to answering this
Adriaan Bloem from CMS Watch says that there is no "perfect" CMS—instead you
have to choose elements that are exactly suited to your own business, and in that way
you'll be fast, efficient and on budget (see page 42).
Paul Burns from Neovise jumpstarts a discussion on "Cloud computing for
sceptics" (page 54) and Martin Kuppinger from KuppingerCole searches for the link
between GRC and IT security (page 66).
During the production of this issue we've also uploaded a plethora of podcasts on
subjects ranging from a great panel discussion on SIEM (page 74) to how a company
has linked key corporate performance data with operational performance (with
arcplan, on page 36). Check out for more information on our
other exclusive and panel podcasts.
One of the most dynamic discussions I've had the pleasure of hosting is our panel
podcast on application lifecycle management moderated by Julie Craig from Enterprise
Management Associates (EMA), with input from CollabNet, Microsoft and Serena
Software (you’ll find it on page 28).
Hopefully in this issue of ETM you'll find the answers and solutions to at least
some of the challenges facing IT professionals today.
Thank you for reading, and if you would like to contribute to any future issues
of ETM, please feel free to contact us at or via email at